Bruker Nano Surfaces & Metrology

About

Innovating Metrology from Lab to Fab - Powering Every Semiconductor Process

Bruker is a market leader in advanced metrology and surface characterization solutions that support the full semiconductor workflow, from R&D labs to high-volume fabs. Our comprehensive portfolio includes AFM, stylus and optical profilometry, nanoindentation, WLI, X-ray metrology, ellipsometry, and nanoscale IR spectroscopy. Bruker systems enable precise, non-destructive analysis in a wide range of applications, including logic and memory devices, power semiconductors, MEMS, advanced packaging, and substrates. With industry-proven performance and automation-ready platforms, Bruker empowers process control, failure analysis, and materials innovation across all technology nodes.